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Surface analysis of softened paper by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and the Kawabata evaluation system.
CARR CM; PARFITT, M.; VICKERMAN, J. C; MITCHELL, R; ..
Journal of Materials Science. 2003;38(10):2171-2177.
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Volume:
38(10)
Start page:
2171
End page:
2177
Pagination:
2171-2177
Digital Object Identifier:
10.1023/A:1023728114543
Related website(s):
- Related website http://www.springerlink.com/content/n242r12256013x81/
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Active
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Manchester eScholar ID:
uk-ac-man-scw:1a9224
Created:
6th August, 2009, 15:21:44
Last modified:
31st December, 2012, 19:10:35