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Electrical characterization and preliminary beam test results of 3D silicon CMS pixel detectors

Koybasi, Ozhan;

IEEE Trans. Nucl. Sci. 2011;58:1315-1323.

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Bibliographic metadata

Content type:
Author(s):
Published date:
Journal title:
Volume:
58
Start page:
1315
End page:
1323
Total:
9
Pagination:
1315-1323
Digital Object Identifier:
10.1109/TNS.2011.2117439
Access state:
Active

Institutional metadata

University researcher(s):

Record metadata

Manchester eScholar ID:
uk-ac-man-scw:139526
Created by:
Salih, Sabah
Created:
11th December, 2011, 18:15:52
Last modified by:
Salih, Sabah
Last modified:
11th December, 2011, 18:15:52

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